Devices on Base of TlIn<sub>1‑x</sub>Pr<sub>x</sub>Se<sub>2</sub> Crystals for Multipoint Tensometry

Abstract

UDC 537.226.621.315 

 

The given work presents the devices on the base of new TlIn1-xPrxSe2 (0 ≤ x ≤ 0.04) crystals developed to be used in high temperature multipoint tensometry, which allows for raising productivity and reliability of results of measurements at multipoint tensometry.

 

Keywords: multipoint tensometry, photoelectric properties, directional strain, acoustic probe.

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