Аннотация
It is justified the use of the sliding beam of X-rays for the study of substructure (crystallites disper- sion, dislocations density) of a superficial layers having essential inhomogeneity of structure by depth. There are presented comparative data of physical broadenings (β) of interference lines, defined by methods of sli- ding beam and symmetrical survey of metals’ superficial layers by Bragg-Brentano, modified by electro- spark alloying. The essential difference of values of β is shown, which explains possible inconsistency of subsequent calculations of substructure parameters in the case of survey by the second variant.