Rezumat
CZU 621.315.592
DOI https://doi.org/10.52577/eom.2025.61.5.65
The effect of γ-ray irradiation on the mechanism of current transfer in the Al/p-CdTe/Mo structure has been studied. The X-ray diffraction phase analysis allowed to establish the real structure of the material: Al/n-Al2O3/p-CdTe/n-MoO3/Mo, which can be represented as n+-p-n in its final form. In this structure, the base (p-CdTe) is in contact on both sides with wide-gap thin oxide layers of n-Al2O3 and n-MoO3. The n+-p-junction is ideal, but the p-n- junction is not ideal. In the reverse direction (when Al is supplied with a “plus” and Mo is supplied with a “minus”) of the current, minor non-equilibrium charge carriers accumulate near the ideal contact, leading to the formation of an extended sublinear section on the reverse current-voltage characteristic of the structure before and after irradiation. That phenomenon is explained within the framework of the theory of the "injection depletion effect" by the injection of electrons from the rear junction of n-MoO3/p-CdTe and the appearance of diffusion and drift currents which are directed opposite to each other in the base of the structure. The shape and length of the sublinear section are preserved due to the high value of the frontal – ideal potential barrier n+-p, while in the range of different values of radiation doses F, Gy: (104, 105, 106 and 107), the distribution profile of non-equilibrium charge carriers practically does not change in the base of the structure.
Keywords: CdTe, γ-irradiation, sublinear region, current transfer mechanism, injection, diffusion and drift currents.