Abstract
UDC 546.28:535.343.2
The Fourier-Raman spectroscopy methods were used to study the influence of γ-irradiation on the focal ratio of boron atoms in the crystal lattice borosilicate. It is shown that when the content of B2O3 in the composition of SiO2 ~ 1,5 mass%, the γ-irradiation in small doses of Dγ = 0,5–30 kGy in borosilicates leads to a transition from the tetrahedral boron status into a trigonal one. It is demonstrated that at Dγ ≤ 30 kGy a radiation-stable state is formed with a maximum of the borosilicate trigonal-coordinated boron atoms.
Keywords: Fourier-Raman spectroscopy, borosilicate, γ-irradiation.