Аннотация
The morphology and microstructure of silicophosphate films, undoped and doped by neodymium, were consi-dered in the work. Strength characteristics (Young modulus and hardness) of the SiO2-P2O5-Nd2O3 and SiO2-P2O5 films under Pmax = 10 mN were also studied. In addition, the investigation of the soda-lime glass (SLG) substrate and, in general, of the composite structures SiO2-P2O5-Nd2O3/SLG and SiO2-P2O5/SLG (Рmax = 10, 100 and 900 mN) was carried out. A specific microstructure, composed of the basic film on which structural units of small dimensions, about 0.1–0.2 μm, quasi-uniformly distributed, together with roundly structural units from several to tens micrometers, was detected on the SiO2-P2O5-Nd2O3 and SiO2-P2O5 film surfaces. The film surface morphology and microstructure exhi-bited a high time-stability as a result of the long-term rest (3 years). It is determined that both the films and composite structures possess the strength properties of high quality.